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15th IEEE European Test Symposium
(ETS 2010)

May 24-28, 2010
Prague, Czech Republic

http://ets2010.felk.cvut.cz/

CALL FOR PAPERS
Scope --Publications -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics, and new trends in the area of electronic-based circuit and system testing. In 2010, ETS will take place in Prague, Czech Republic. ETS’10 is being organized by the Czech Technical University in Prague together with Technical University in Liberec, and is sponsored by the Test Technology Technical Council (TTTC) of the IEEE Computer Society. As a new initiative in 2010, a Test Spring School will be organized in conjunction with ETS'10.

You are invited to participate and submit your contributions to ETS’10. The areas of interest include (but are not limited to) the following topics:

  • Automatic Test Generation
  • Fault Modeling and Simulation
  • Current-Based Test
  • Power Issues in Test
  • Thermal Test
  • Delay and Performance Test
  • High-Speed IO/Interconnect Test
  • Signal Integrity Test
  • Nanometer Technologies Test
  • ATE Hardware and Software
  • Standards in Testing
  • Test(ability) Synthesis
  • Built-In Self Test (BIST)
  • Design for Test(ability) (DfT)
  • Test Data Compression
  • On-Line Test
  • Self-Repair Methodologies
  • Test of Reconfigurable Systems
  • Analog, Mixed-Signal, RF Test
  • Memory Test and Repair
  • Microprocessor Test
  • MEMS and Nanotechnology Test
  • Failure Analysis
  • Diagnosis and Debug
  • Design Verification and Validation
  • Test Quality and Reliability
  • Yield Analysis and Enhancement
  • Defect and Fault Tolerance
  • Board and System Test
  • (Embedded) System Test
  • High-Level DfT and TPG
  • System-in-Package (SiP) Test
  • System-on-Chip (SoC) Test

Publications

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ETS’10 will produce Formal Proceedings of selected papers and an Informal Digest of Papers. The best contributions will be selected for submission to regular issues of the“Journal of Electronic Testing: Theory and Applications” (JETTA), published by Springer. A Best Paper Award of ETS`10 will be presented at ETS’11.

Submissions

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ETS’10 seeks original, unpublished contributions of the following types:

  • Scientific papers for the Formal proceedings, presenting novel and complete research work.
  • Workshop-type papers for the Informal Digest, including ‘emerging ideas’ and ‘case studies’.
  • Student Forum contributions presenting individual, on-going thesis work both at the Master and at the PhD level. All participants of the Student Forum will take part in a contest and have the opportunity to present their work in front of an expert jury.
  • Proposals for panels, embedded tutorials, and other special sessions.
  • ‘Vendor Session’ presentations focusing on new features of test related products.

Detailed submission instructions, including selection criteria and publication policies, for the various types of contributions are posted on the ETS’10 web page.

The ETS’10 organizing committee also encourages the organization of fringe meetings and workshops. Details can be found on the ETS`10 web page.

Key Dates

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Submission deadline: December 7, 2009
Notification of acceptance: February 15, 2010
Final copy deadline: March 15, 2010

Additional Information
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Ondej Novák – General Chair
Technical University in Liberec
Studentska 2
46117 Liberec 1, Czech Republic
Tel.: +420 485 353 460
Fax: +420 485 353 112
E-mail: ondrej.novak@tul.cz
Sybille Hellebrand – Program Chair
University of Paderborn
Warburger Str. 100
33098 Paderborn, Germany
Tel:+49 5251 60 3002
Fax: +49 5251 60 4221
E-Mail: sybille.hellebrand@uni-paderborn.de


Committees
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General Chair / Vice Chair
Ondej Novák – TU Liberec, CZ
Einar Aas, Norway U of Science, N

Program Chair / Vice Chair
Sybille Hellebrand – U. Paderborn, D
Eric Larsson – U. Linkoping, S

Topic Chairs
B. Becker, D
N. Nicolici, CAN
S. Hamdioui, NL
M. Renovell, F
H. Kerkhoff, NL
M. Sonza Reorda, I
R. Leveugle, F
J. Tyszer, PL

Industrial Relations Chair/ Vice Chair
H. Manhaeve, B Z. Kotasek, CZ

Publication Chair: C. Metra, I
Publicity Chair: M. Violante, I
Panel Chair: P. Girard, F.
Embedded Tutorial Chair: P. Prinetto, I
ETS Fringe Workshops: P. Harrod, UK
Student Forum Chair: I. Polian, D

Regional Liaisons
L. Carro, Br – South America
S. Kajihara, J - Asia
A. Osseiran - Australia
A. Singh, USA – North America

Program Committee (to include):

M. Abadir, USA
R. Aitken, USA
Z. Al-Ars, NL
L. Anghel, F
D. Appello, I
F. Azais, F
M. Azimane, NL
L. Balado, E
K. Chakrabarty, USA
D. De Venuto, I
S. Di Carlo, I
G. Di Natale, F
R. Dorsch, D
J. Figueras, E
M.-L. Flottes, F
F. Fummi, I
T. Garbolino, P
D. Gizopoulos, GR
S. K. Goel, USA
E. Gramatova, SK
K. Hatayama, J K.
M. Hirech, USA
A. Hlawiczka, PL
M. S. Hsiao, USA
P. Hughes, UK
E. Isern, E.
A. Ivanov, CAN
R. Kapur, USA
A. Krasniewski, PL
R. Krenz-Baath, D
B. Kruseman, NL
S. Kundu, USA
M. Lubaszewski, BR
Y. Makris, USA
E. J. Marinissen, B

P. Maxwell, USA
L. Miclea, RO
S. Mir, F
S. Mitra, USA
Y. Miura, J
Z. Navabi, IR
F. Novak, SLO
A. Orailoglu, USA
S. Ozev, USA
A. Pataricza, H
Z. Peng, S
F. Poehl, D
I. Pomeranz, USA
J. Raik, EE
J. Rajski, USA
A. Richardson, UK
J. Rivoir, D
B. Rouzeyre, F
A. Rubio, E
A. Rueda, E
K. Saluja, USA
P. Sanchez, E
S. Sattler, D
J. Schloeffel, D
J. Segura, E
M. Tahoori, D
J.-P. Teixeira, P
N. Touba, USA
R. Ubar, EE
B. Vermeulen, NL
A. Virazel, F
C. Wegener, D
X. Wen, J
C.-W. Wu, TW
M. Zwolinski, UK

Steering Committee
Chair: H.-J. Wunderlich – U. Stuttgart D

B. Al-Hashimi, UK
B. Becker, D
J. Figueras, E
P. Harrod, UK
J. L. Huertas, E
C. Landrault, F
E.J. Marinissen, B

P. Muhmenthaler, D
Z. Peng, S
P. Prinetto, I
M. Renovell, F
M. Sonza Reorda, I
J. P. Teixeira, P

Y. Zorian, USA

Organizing Committee
H. Kubatova, CZ - Finance
Z. Plíva, CZ - Proceedings
R. Kinc, CZ - Local Arrangement
R. Kinc, CZ - Registration
M. Rozkovec, CZ - Audio/visual
J. Škvor, CZ - Web

For more information, visit us on the web at: http://ets2010.felk.cvut.cz/

The 15th IEEE European Test Symposium (ETS'10) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

PAST CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

TTTC 1ST VICE CHAIR
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

SECRETARY
Christian LANDRAULT
LIRMM - France
Tel. +33-4-674-18524
E-mail landrault@lirmm.fr

ITC GENERAL CHAIR
Gordon W. ROBERTS
McGill University
- Canada
Tel.
E-mail gordon.roberts@mcgill.ca

TEST WEEK COORDINATOR
Yervant ZORIAN
Virage Logic Corporation - USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Piraeus
- Greece
Tel. +30-210-414-2372
E-mail dgizop@unipi.gr

STANDARDS
Rohit KAPUR

Synopsys
, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Zebo PENG
Linköping University - Sweden
Tel. +46-13-282-067/-281-000
E-mail zpe@ida.liu.se

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

ELECTRONIC MEDIA
Alfredo BENSO
Politecnico di Torino - Italy
Tel. +39-011-564-7080
E-mail alfredo.benso@polito.it

 

PRESIDENT OF BOARD
Yervant ZORIAN
Virage Logic Corporation- USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com

SENIOR PAST CHAIR
Paolo PRINETTO
Politecnico di Torino - Italy
Tel. +39-011-564-7007
E-mail Paolo.Prinetto@polito.it

TTTC 2ND VICE CHAIR
Chen-Huan CHIANG

Alcatel-Lucent
- USA
Tel. +1-973-386-6759
E-mail chenhuan@alcatel-lucent.com

FINANCE
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

IEEE DESIGN & TEST EIC
K.T. (Tim) CHENG
University of California, Santa Barbara - USA
Tel. +1-805-893-72942
E-mail timcheng@ece.ucsb.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG
Alcatel-Lucent
- USA
Tel. +1-973-386-6759
E-mail chenhuan@alcatel-lucent.com

TECHNICAL ACTIVITIES
Matteo SONZA REORDA
Politecnico di Torino - Italy
Tel.+39-011-564-7055
E-mail matteo.sonzareorda@polito.it

ASIA & PACIFIC
Kazumi HATAYAMA
STARC - Japan
Tel. +
E-mail hatayama.kazumi@starc.or.jp

LATIN AMERICA
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

NORTH AMERICA
William R. MANN
SW Test Workshop - USA
Tel. +1-949-645-3294
E-mail william.mann@ieee.org

COMMUNICATIONS
Cecilia METRA
Università di Bologna - Italy
Tel. +39-051-209-3038
E-mail cmetra@deis.unibo.it

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Virage Logic Corporation- USA
Tel. +1-510-360-8035
E-mail yervant.zorian@viragelogic.com


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